🧱 (date_of_test): Handle epoch format for date_of_test

leka · Sep 20, 2022 · 8e3a094 · 8e3a094
1 parent 120e127
commit 8e3a094
Show file tree

Hide file tree

Showing 4 changed files with 65 additions and 15 deletions.
diff --git a/libs/SerialNumberKit/include/SerialNumberFormater.h b/libs/SerialNumberKit/include/SerialNumberFormater.h
@@ -23,6 +23,9 @@ class SerialNumberFormater
 	void setMCUID(std::span<uint8_t> serial_number, uint32_t offset, uint8_t number_of_digits);
 
   private:
+	void setDateOfTestFromYYMMDD(std::span<char> content, std::span<uint8_t> date_of_test) const;
+	void setDateOfTestFromEpoch(std::span<char> content, std::span<uint8_t> date_of_test) const;
+
 	interface::MCU &_mcu;
 	const Config _config;
 };

diff --git a/libs/SerialNumberKit/source/SerialNumberFormater.cpp b/libs/SerialNumberKit/source/SerialNumberFormater.cpp
@@ -24,7 +24,19 @@ auto SerialNumberFormater::setDateOfTest(std::span<uint8_t> partial_serial_numbe
 	date_of_test.fill('X');
 
 	if (auto file = FileManagerKit::File {_config.date_of_test_path}; file.is_open()) {
-		file.read(date_of_test);
+		auto file_content = std::array<char, 16> {};
+
+		file.read(file_content);
+
+		// ? epoch is 10 characters long, so the file size is at least 8 bytes
+		if (auto format_is_epoch = file.size() > 8; format_is_epoch) {
+			setDateOfTestFromEpoch(file_content, date_of_test);
+		}
+		// ? some robot still use the format YYMMDD
+		if (auto format_is_YYMMDD = file.size() <= 8; format_is_YYMMDD) {
+			setDateOfTestFromYYMMDD(file_content, date_of_test);
+		}
+
 		file.close();
 	}
 
@@ -33,6 +45,23 @@ auto SerialNumberFormater::setDateOfTest(std::span<uint8_t> partial_serial_numbe
 	return std::size(date_of_test);
 }
 
+void SerialNumberFormater::setDateOfTestFromYYMMDD(std::span<char> content, std::span<uint8_t> date_of_test) const
+{
+	std::copy(content.begin(), content.begin() + std::size(date_of_test), date_of_test.begin());
+}
+
+void SerialNumberFormater::setDateOfTestFromEpoch(std::span<char> content, std::span<uint8_t> date_of_test) const
+{
+	std::time_t epoch = std::atoll(content.data());
+	std::array<char, 8> epoch_c_array {};
+
+	struct tm local_time;
+	localtime_r(&epoch, &local_time);
+	std::strftime(epoch_c_array.data(), std::size(epoch_c_array), "%y%m", &local_time);
+
+	std::copy(epoch_c_array.begin(), epoch_c_array.begin() + std::size(date_of_test), date_of_test.begin());
+}
+
 void SerialNumberFormater::setMCUID(std::span<uint8_t> partial_serial_number, uint32_t offset, uint8_t number_of_digits)
 {
 	constexpr auto MAX_MCU_ID_DIGITS = 24;

diff --git a/libs/SerialNumberKit/tests/SerialNumberFormater_test.cpp b/libs/SerialNumberKit/tests/SerialNumberFormater_test.cpp
@@ -22,13 +22,13 @@ class SerialNumberFormaterTest : public ::testing::Test
 	void SetUp() override
 	{
 		std::ofstream dot_stream {config.date_of_test_path, std::ios::binary};
-		dot_stream << current_date_of_test_str;
+		dot_stream << current_date_of_test_epoch_str;
 		dot_stream.close();
 	}
 
 	void TearDown() override { std::filesystem::remove(config.date_of_test_path); }
 
-	std::string current_date_of_test_str = "220619\n";
+	std::string current_date_of_test_epoch_str = "1663086252\n";   // Tuesday, September 13, 2022 4:24:12 PM
 
 	mock::MCU mock_mcu;
 	SerialNumberFormater::Config config {.date_of_test_path = "/tmp/date_of_test"};
@@ -54,6 +54,24 @@ TEST_F(SerialNumberFormaterTest, setPrefix)
 
 TEST_F(SerialNumberFormaterTest, setDateOfTest)
 {
+	auto expected_serial_number = std::array<uint8_t, 32> {"LK-2209"};
+	auto actual_serial_number	= std::array<uint8_t, 32> {"LK-"};
+
+	auto prefix_size = std::size("LK-") - sizeof('\0');
+
+	auto actual_prefix_number_size = serial_number_formater.setDateOfTest(actual_serial_number, prefix_size);
+	EXPECT_EQ(actual_serial_number, expected_serial_number);
+	EXPECT_EQ(actual_prefix_number_size, std::size("2209") - sizeof('\0'));
+}
+
+TEST_F(SerialNumberFormaterTest, setDateOfTestYYMMDD)
+{
+	std::string current_date_of_test_YYMMDD_str = "220619\n";
+
+	std::ofstream dot_stream {config.date_of_test_path, std::ios::binary};
+	dot_stream << current_date_of_test_YYMMDD_str;
+	dot_stream.close();
+
 	auto expected_serial_number = std::array<uint8_t, 32> {"LK-2206"};
 	auto actual_serial_number	= std::array<uint8_t, 32> {"LK-"};
 
@@ -83,36 +101,36 @@ TEST_F(SerialNumberFormaterTest, setMCUID)
 	auto expected_serial_number = std::array<uint8_t, 32> {};
 	auto actual_serial_number	= std::array<uint8_t, 32> {};
 
-	auto prefix_plus_date_of_test_size = std::size("LK-2206") - sizeof('\0');
+	auto prefix_plus_date_of_test_size = std::size("LK-2209") - sizeof('\0');
 	auto number_of_digits			   = 0;
 
 	EXPECT_CALL(mock_mcu, getID).WillRepeatedly(Return(mcu_id_returned));
 
-	actual_serial_number   = std::array<uint8_t, 32> {"LK-2206"};
+	actual_serial_number   = std::array<uint8_t, 32> {"LK-2209"};
 	number_of_digits	   = 10;
-	expected_serial_number = std::array<uint8_t, 32> {"LK-22062A2B2C2D3A"};
+	expected_serial_number = std::array<uint8_t, 32> {"LK-22092A2B2C2D3A"};
 	serial_number_formater.setMCUID(actual_serial_number, prefix_plus_date_of_test_size, number_of_digits);
 	EXPECT_EQ(actual_serial_number, expected_serial_number);
 
-	actual_serial_number   = std::array<uint8_t, 32> {"LK-2206"};
+	actual_serial_number   = std::array<uint8_t, 32> {"LK-2209"};
 	number_of_digits	   = 19;
-	expected_serial_number = std::array<uint8_t, 32> {"LK-22062A2B2C2D3A3B3C3D4A4"};
+	expected_serial_number = std::array<uint8_t, 32> {"LK-22092A2B2C2D3A3B3C3D4A4"};
 	serial_number_formater.setMCUID(actual_serial_number, prefix_plus_date_of_test_size, number_of_digits);
 	EXPECT_EQ(actual_serial_number, expected_serial_number);
 
-	actual_serial_number   = std::array<uint8_t, 32> {"LK-2206"};
+	actual_serial_number   = std::array<uint8_t, 32> {"LK-2209"};
 	number_of_digits	   = 24;
-	expected_serial_number = std::array<uint8_t, 32> {"LK-22062A2B2C2D3A3B3C3D4A4B4C4D"};
+	expected_serial_number = std::array<uint8_t, 32> {"LK-22092A2B2C2D3A3B3C3D4A4B4C4D"};
 	serial_number_formater.setMCUID(actual_serial_number, prefix_plus_date_of_test_size, number_of_digits);
 	EXPECT_EQ(actual_serial_number, expected_serial_number);
 }
 
 TEST_F(SerialNumberFormaterTest, setMCUIDExceedingNumberOfDigits)
 {
-	auto expected_serial_number = std::array<uint8_t, 32> {"LK-22062A2B2C2D3A3B3C3D4A4B4C4D"};
-	auto actual_serial_number	= std::array<uint8_t, 32> {"LK-2206"};
+	auto expected_serial_number = std::array<uint8_t, 32> {"LK-22092A2B2C2D3A3B3C3D4A4B4C4D"};
+	auto actual_serial_number	= std::array<uint8_t, 32> {"LK-2209"};
 
-	auto prefix_plus_date_of_test_size = std::size("LK-2206") - sizeof('\0');
+	auto prefix_plus_date_of_test_size = std::size("LK-2209") - sizeof('\0');
 
 	EXPECT_CALL(mock_mcu, getID).WillRepeatedly(Return(mcu_id_returned));
 

diff --git a/libs/SerialNumberKit/tests/SerialNumberKit_test.cpp b/libs/SerialNumberKit/tests/SerialNumberKit_test.cpp
@@ -35,7 +35,7 @@ TEST_F(SerialNumberKitTest, initialization)
 
 TEST_F(SerialNumberKitTest, getSerialNumber)
 {
-	auto expected_serial_number = std::array<uint8_t, 32> {"LK-22062A2B2C2D3A3B3C3D4A4B4C4D"};
+	auto expected_serial_number = std::array<uint8_t, 32> {"LK-22092A2B2C2D3A3B3C3D4A4B4C4D"};
 
 	EXPECT_CALL(mock_mcu, getID).WillOnce(Return(mcu_id_returned));
 
@@ -46,7 +46,7 @@ TEST_F(SerialNumberKitTest, getSerialNumber)
 
 TEST_F(SerialNumberKitTest, getShortSerialNumber)
 {
-	auto expected_serial_number = std::array<uint8_t, 16> {"LK-22062A2B2C2D"};
+	auto expected_serial_number = std::array<uint8_t, 16> {"LK-22092A2B2C2D"};
 
 	EXPECT_CALL(mock_mcu, getID).WillOnce(Return(mcu_id_returned));