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Changed times and hue steps in TC-CC-3.3 so tolerance does not span wrap #37308
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PR #37308: Size comparison from e80451c to 962fd93 Full report (71 builds for bl602, bl702, bl702l, cc13x4_26x4, cc32xx, cyw30739, efr32, esp32, linux, nrfconnect, nxp, psoc6, qpg, stm32, telink, tizen)
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andy31415
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Feb 4, 2025
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LGTM however we should wait on the dependency in https://github.com/CHIP-Specifications/chip-test-plans/pull/4933 to merge first.
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This PR updates TC-CC-3.3.yaml file. This PR is linked to Fixes #475. The [PR #35525] was used as guidance.
It also includes changes in test specifications that were done in PR 4993.
Updates:
Testing:
To not skip test steps CC.S.F00 needs to be 1. Changed this value in src/app/tests/suites/certification/ci-pics-values.
In the first terminal:
rm /tmp/chip_*
In the second terminal:
In the third terminal: